In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
Alpha Software (781-229-4500) has introduced manufacturing quality solutions built on its Alpha TransForm no‑code platform to ...
As semiconductor chip technology advances towards nanometre and sub-nanometre scales, the demands becomes exponentially more ...
Scientists from China have developed a new deep-learning method for detecting defects in PV cells. Analyzing electroluminescence (EL) images, the novel system utilizes the YOLOv8 convolutional neural ...
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