In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
Dr. Chris Hillman, Global AI Lead at Teradata, joins eSpeaks to explore why open data ecosystems are becoming essential for enterprise AI success. In this episode, he breaks down how openness — in ...
Dr. Chris Hillman, Global AI Lead at Teradata, joins eSpeaks to explore why open data ecosystems are becoming essential for enterprise AI success. In this episode, he breaks down how openness — in ...
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