The CoreAFM is the outcome of smartly integrating the core components of AFM to achieve utmost flexibility and user-friendliness. The CoreAFM is set up to conduct AFM at its best, thanks to its ...
InSight 300 is a fabrication-ready, automated atomic force microscope (AAFM) engineered for dependable and economical inline metrology in high-volume semiconductor production settings. Boasting a ...
Surface roughness influences many mechanical properties, including friction and adhesion, surface reactivity, semiconductor substrate quality, and surface interaction with electromagnetic waves, ...
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